Equipment
Profilometer
Model:
Ambios XP-200 Surface Profiler
Capabilities:
This tool allows one and two dimensional contact scanning of surfaces to reveal topographical variations for analysis of step heights and surface roughness.
Cost:
Calendar for Reservations:
Specifications:
- Vertical range: 10 Å to 400 μm.
- Vertical resolution: 1.5 Å in the 10 µm range to 62 Å at 400 μm.
- Scan Length range: 50 mm maximum
- Maximum Sample dimensions: 200 mm of diameter and thickness up to 30 mm.
- Stage Positioning: Motorized and Programmable
- Sample Viewing: Color Camera
- Zoom Magnification: 40x to 160x
- Stylus (standard): Diamond, 2.5 µ radius
- Stylus Tracking Force: Programmable from 0.05 mg to 10 mg
A stylus is moved vertically in contact with a sample and then moved laterally across the sample for a specified distance and specified contact force. A profilometer can measure small surface variations in vertical stylus displacement as a function of position. A typical profilometer can measure small vertical features ranging in height from 1 nanometre to 1 millimeter. The height position of the diamond stylus generates an analog signal which is converted into a digital signal that is stored, analyzed and displayed. The radius of the diamond stylus ranges from 20 nanometres to 50 nm, and the horizontal resolution is controlled by the scan speed and data signal sampling rate. The stylus tracking force can vary depending on the stability of the sample.
