Equipment
Scanning Transmission Electron Microscope
Model:
FEI Tecnai F20 G2 Scanning Transmission Electron Microscope (S)TEM
Capabilities:
This tool is a high resolution field emission microscope that allows sub-nanometer (nearly atomic scale) resolution on thin samples. STEM mode facilitates nanometer scale compositional mapping using EDAX xray spectrometer functions.
Cost:
Calendar for Reservations:
Specifications:
- Schottky field emission emitter.
- 200KV accelerating voltage.
- ~0.14nm resolution in TEM mode.
- bottom mounted Gatan camera system for digital image capture. STEM mode functions.
- EDAX xray spectrometer system with mapping capability.
On-line Manual:
TEM systems use high energy charged particles (electrons) to image samples in a vacuum environment. A series of magnetic lenses focuses the electrons either to a small point that is scanned or to a collimated beam. Transmitted electrons are used to image local variations in samples. Xrays are also generated that are characteristic of the elements present in the sample. Thus, high resolution imaging can be combined with chemical identification.
